Mechanical design for tailoring the resonance harmonics of an atomic force microscope cantilever during tip–surface contact
نویسندگان
چکیده
We describe an atomic force microscope cantilever design for which the second flexural mode frequency can be tailored relative to the first mode frequency, for operation in contact with a substrate. A freely resonating paddle internal to the cantilever reduces the stiffness of the second flexural mode relative to the first while nearly maintaining the mass of the original cantilever. Finite element analysis is used to predict the performance of various cantilever designs and several cantilevers are fabricated and tested. This strategy allows the ratio of the first two resonant modes f 2/f 1 to be controlled over the range 1.6–4.5. The ability to vary f 2/f 1 could improve a variety of dynamic contact-mode measurements. (Some figures in this article are in colour only in the electronic version)
منابع مشابه
Sensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory
A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obta...
متن کاملSensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory
A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obta...
متن کاملStudy of the flexural sensitivity and resonant frequency of an inclined AFM cantilever with sidewall probe
The resonant frequency and sensitivity of an atomic force microscope (AFM) cantilever with assembled cantilever probe (ACP) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. The proposed ACP comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidew...
متن کاملStudy of the flexural sensitivity and resonant frequency of an inclined AFM cantilever with sidewall probe
The resonant frequency and sensitivity of an atomic force microscope (AFM) cantilever with assembled cantilever probe (ACP) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. The proposed ACP comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidew...
متن کاملTip Effect of the Tapping Mode of Atomic Force Microscope in Viscous Fluid Environments
Atomic force microscope with applicable types of operation in a liquid environment is widely used to scan the contours of biological specimens. The contact mode of operation allows a tip to touch a specimen directly but sometimes it damages the specimen; thus, a tapping mode of operation may replace the contact mode. The tapping mode triggers the cantilever of the microscope approximately at re...
متن کامل